Abstract

• The sensitivity of the X ray detection has been investigated for low -elements. The sample preparation and measurement were made for low elements to determine the influence of the pelletizing pressure on sensitivity. Depending on characteristics of SPECTRO XEPOS Spectrometer, the minimum pelletizing pressure of the sample for low element was determined. The results indicated that the minimum pelletizing pressure of the samples is required for the reduction of surface effect and to yield precise results. For aluminum and silicon, the minimum pressed weight of 14 ton is needed, but for potassium, a pressed weight of 12 ton is adequate. For sulfur and calcium, the pressed weight of 10 ton is sufficient. The optimized values have been tested and demonstrated on standard reference material GSR 07. It is observed that in the experimental configurations currently installed, these optimum valued allowed to determine the certified values with an accuracy of 1.33% for low- elements.