Abstract

• Pure CdO and Cu (1 mol%, 2 mol%, 3 mol% & 4 mol%) doped CdO thin films on glass substrate were successfully fabricated by using the spin coating technique. The samples were annealed at 500˚C for 1 hour. The films structures were studied by X-ray diffraction (XRD). From the XRD analysis, lattice parameters, unit cell volume and crystallite size of the samples are calculated. Also XRD studies reveal that pure CdO and Cu doped CdO thin films are showed cubic structure with maximum peak (111) planes. Furthermore, the XRD data, dislocation density and microstrain are also evaluated. From the optical properties, absorption coefficient and the band gap energy of the samples are calculated.