Abstract

• Magnesium-Copper mixed ferrite Mg0.5Cu0.5Fe2O4 was prepared by usual ceramic method at 1000°C for 8h. Structural and microstructural characteristics of the sample were characterized by using X-ray diffraction (XRD) and Scanning Electron Microscopy (SEM). Temperature dependent electrical conductivities were investigated in the temperature range of 299K-573K region. Furthermore, Mg0.5Cu0.5Fe2O4 thin film was deposited on p-Si substrate by using thermal diffusion method at 500°C for 1h.Microstructural characteristics and film thickness were examined by SEM. Current–Voltage (I-V) characteristics of the film were also investigated under the different illumination of visible light source.