GROWTH AND CHARACTERIATION OF nTiO3 PEROVSKITE FILM ON SI SUSTRATE
Abstract
- inc titanate (nTiO3; T) powders were successfully prepared by a solid state reaction method. T powder were heated at various calcination temperatures ranging from 500 C to 850 C for 2h. Powder samples were characterized using thermo gravimetric (TGA), differential thermal analysis (DTA), X-ray diffractrometer (XRD), scanning electron microscopy (SEM). The second phases such as nO and TiO2 were detected in the powders calcined below 850 C. A single perovskite of the T powders was found with calcination temperatures at 850 C. The TGA-DTA results corresponded to the XRD investigation. The crystalline powders were mixed with the solvent and deposited onto the silicon substrates by using spin coating method. Annealing of the deposited films were performed at temperatures ranging from 400oC to 800oC for 1h. The X-ray diffraction, scanning electron microscope and UV-vis spectroscopy have been employed to characterize the deposited films. The obtained 2D materials surface were nTiO3 with cubic structure. The absorbance spectra exhibited visible light emission and optical band gap was 3.7 eV.
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Year
- 2018
Author
-
Win Pa Pa Khaing
Subject
- Physics
Publisher
- Myanmar Academy of Arts and Science (MAAS)